Description : Position Summary
Position Summary
Under the supervision of Professor Robert F. Klie. This position will focus on atomic-resolution characterization of materials using the brand-new double-corrected, magnetic-field-free, monochromated STEM / TEM instrument at UIC.
While the work will be carried out at UIC, a successful applicant must be able to travel to Japan to run experiments on a prototype instrument.
The successful applicant will have experience in high-resolution transmission electron microscopy imaging, including 4D-STEM, DPC, magnetic imaging, and electron energy-loss spectroscopy.
Dr. Klie's Nanoscale Physics Group has access to the UIC Research Resources Center (RRC), which provides a world-class research environment with an array of electron beam instruments and in-situ capabilities, including the first aberration-corrected, magnetic-field-free and monochromated JEOL Z-20
Duties & Responsibilities
The successful candidate will be in charge of developing and utilizing the newly installed JEOLZ200MF-MONO, working with users in the UIC RRC, and traveling to Japan to work on the first prototype instrument.
In particular, the research will focus on developing 4D-STEM, DPC, and spectroscopy approaches for magnetic-field-free imaging, including low-temperature measurements.
- The dissemination of data is another important aspect of this position. A successful candidate is expected to draft, revise, and publish scientific manuscripts, give presentations at local and international conferences, and also mentor undergraduate / graduate students in the Nanoscale Physics Group.
- Perform other related duties and participate in special projects as assigned.
To apply, submit your CV and a brief research statement (three pages maximum). Applicants that are confirmed to meet the minimum qualifications will be requested to provide contact information for at least two references.
Qualifications :
Minimum Qualifications
A PhD in Physics, Chemistry, or Materials Science is required. Knowledge of atomic-resolution STEM characterization, 4D-STEM, DPC, and other analytical scanning transmission electron microscopy approaches, as well as electron spectroscopy or cryo-microscopy, is required.
Preferred Qualifications